| Resumen |
Due to the relationships between the inputs and the relevant events or conditions are not trivial when the verification is performed there are very difficult cases to test during in the model of digital system. If the coverage directed test generation is applied, a set of holes is detected at the end of the simulation and one or more conditions need to be tested in the new iteration.
This research proposes a heuristic verification method based on the Binary Particle Swarm Optimization algorithm to obtain sets of test vectors that maximize the functional coverage in a FIFO memory. One advantage is that the method uses a few particles to obtain good results. The experimental results show that functional coverage over ninety percent were obtained using a small number of particles in different scenarios to obtain results over ninety coverage percent.
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